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SW adopts a contactless next-generation SW.
Improved visibility through high resolution Adoption of wireless transmission to meet on-site needs Innovative features with excellent design It has become a device suitable for the next generation in every aspect. *For more details, please feel free to contact us.*
Generates sharp edges of ±40V / 1000V/μs, compatible with NVM, MEMS, and mid-power device testing! PXIe-compatible high-voltage pulse source unit.
It is a single-channel high-voltage semiconductor pulse generation unit that can output adjustable high-precision, high-voltage pulse signals. - High Voltage Range It supports an output of ±40V, meeting the technical conditions for NVM (non-volatile memory) testing. - High Voltage with Fast Slew Rate A high-voltage pulse source that achieves a fast slew rate of 1000V/μs enables the generation of sharper edges. - PXIe Interface Based on PXIe interface design, it can be fitted into a standard PXIe chassis. Multi-channel expansion is easy, and it supports chassis sharing with other PXIe measurement instruments, allowing for the construction of a highly convenient semiconductor testing system. - Multi-Level Pulse Output It supports 2-level and 3-level pulse outputs, enabling combinations of multiple pulses to meet the needs for multi-stage pulses in semiconductor testing. - ALWG Function It supports user text editing based on CSV, allowing for the output of arbitrary linear waveform signals. - Software Features The GUI is designed to be very intuitive and concise, making it easy to configure the output voltage waveform settings for each channel.
